Silicon Test
Eyes in the Die
LogicVision provides unique capabilities for the fast and accurate test and measurement of silicon devices. Our approach is to insert test structures, called "eyes in the die," at strategic locations throughout the device. These "eyes" are design IP components specialized for the test and measurement of different portions of the design. “Eyes” exist for high-speed logic, embedded memories of all types, mixed-signal components, and very high-speed SerDes I/O. All "eyes" run at full functional speeds and are all accessed from a common low-speed standard five-pin test interface. This allows all test and measurement to be performed using any external tester (including low-cost testers). The "eyes", added to the device, not only provide industry-leading test and measurement capabilities during the manufacturing test phase, but continue to monitor for defects throughout the entire life of the chip, from initial design debug through board and system test and into the field.
The various "eyes" design components are automatically generated and integrated into the design and then fully verified using a comprehensive suite of design automation tools. LogicVision’s unique fifth-generation industry-leading automation flow ensures the successful optimization and integration of "eyes" features and capabilities for a given design with minimal impact on design schedule.
ETCreate for Silicon Test
The ETCreate family of products consists of embedded test IP and design automation software that provide embedded test solutions for different components of an ASIC/SoC design including memory, logic, mixed-signal and board-level components.
Memory Test Products- ETMemory - Memory BIST
- ETLogic - Logic BIST
- ScanBurst - Scan Insertion
- ETCompression - ATPG Compression
- ETBoundary - Boundary Scan
- ETSystemMemory - Embedded External Memory Test