Memory Test & Repair
Embedded memories represent a significant and growing percentage of the die. An effective memory test and yield optimization strategy is therefore a vital component of any design project.
LogicVision’s memory BIST solution, ETMemory™, provides the industry’s most advanced memory test and repair capabilities. It provides highly comprehensive test and diagnostic capabilities to address the quality requirements of new process nodes and memory designs. ETMemory also provides complete on-chip repair analysis as well as self-repair capabilities. This allows some or all of the repair process to be performed on chip enabling different trade-offs between silicon overhead and test time to be achieved. ETMemory also provides advanced design automation to ensure that all necessary embedded test and repair capabilities can be integrated quickly and efficiently into the design. This is key as the number of memories continues to grow.
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Be ready with LogicVision's memory test and self-repair solution. Click here to learn more about ETMemory. |
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