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Automotive Electronics Test

As automotive electronics continue to grow in both performance and density, automotive semiconductor suppliers are facing growing challenges in the areas of quality, reliability and cost. LogicVision’s industry leading and field proven BIST solutions represent highly cost-effective approaches to achieving extremely high semiconductor device quality and reliability. Because of their pervasive nature throughout the die, the BIST capabilities also provide unique performance characterization and monitoring capabilities, useful for both design improvement as well as system reliability monitoring. LogicVision’s BIST capabilities can play a significant part in addressing today’s automotive semiconductor challenges.

Datasheet
Addressing Automotive Electronics Challenges White Paper
Datasheet
LogicVision's Automotive Electronics Solution Overview