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Yield Insight

White Paper

Yield Insight is a systematic yield learning solution that leverages detailed yield and manufacturing test data, available from LogicVision's industry-leading embedded test products, to help accelerate yield ramps and improve overall yields.

Nanometer-scale designs and the growing analog content in systems-on-chips (SoCs) challenge semiconductor vendors with increasing variability in the manufacturing processes and growing design-process interactions. The result is an increasing number of yield, performance and quality issues, with longer yield ramp-up times, unexpected yield excursions during production, and quality issues in the end product that result in field returns. Yield Insight offers a structured yield learning approach, designed to enable semiconductor vendors to understand the root causes of yield loss and to obtain actionable information to feed back to the design, fab and test functions to help remedy yield issues.

Yield Insight comprehends the large volume of available semiconductor manufacturing and test data, especially design component level failure and performance information from LogicVision's embedded test products. Yield Insight can analyze yield issues down to the design component level, and for example identify design blocks that are failing the most often and the factors that these failures are correlated to, or determine how yields would be affected by changing memory redundancy.  

Yield Insight features an automated yield analysis approach and scripting capabilities that allow users to create data-mining rules that sift through the test and yield data to automatically identify potential issues. Semiconductor vendors can use Yield Insight to make their yield analysis procedures automated, repeatable and standard across different designs and teams.