Products Overview
LV2005 is LogicVision’s latest release of its integrated environment for debug, characterization, and manufacturing test of complex integrated circuits and systems. LV2005 consists of three major product families, which together provide a progression of test, debug, characterization, and analysis related benefits.
ETCreate™ for Silicon Test
ETCreate family of products consists of embedded test IP and corresponding design automation software that enable high-quality, low-cost testing of ASIC and SoC designs.
Silicon Insight™ for Silicon Diagnostics
Silicon Insight™ family of products interact with LogicVision's embedded test IP and interface to external ATE or customer's performance board through a desktop PC to identify and analyze device failures and facilitate Device-Under-Test characterization. These products enable fast silicon bring-up and lower test costs through the support of interactive or test program controlled at-speed testing, data logging, and debug of silicon incorporating LogicVision's embedded test IP.
Yield Insight for Silicon Analysis
Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data, available from LogicVision's industry-leading embedded test products, to provide detailed sub-die level failure and performance monitoring capabilities to help accelerate yield ramps and improve overall yields.
