Contact LogicVisionSite Map
LogicVision SolutionsLogicVision ProductsCompanyLogicVision SupportInvestorsLogicVision News and Events
APPLICATION-
SPECIFIC SOLUTIONS:

MEMORY TEST & REPAIR
The industry’s most advanced memory test and repair capabilities.

TEST FOR LOW DPM
Addresses today’s growing quality and time-to-market challenges.

EMBEDDED DRAM SELF-TEST
Comprehensive solution for testing and repairing any 3rd party eDRAMs.

AUTOMOTIVE ELECTRONICS TEST
Solutions for today’s automotive semiconductor.
LogicVision, a leader in at-speed embedded test, provides nanometer test IP, silicon debug, and yield learning software solutions. The ETCreate™ tools instantiate test structures into the design's netlist. These embedded structures operate as "eyes in the die," observing and testing the device at its operating speed. The Silicon Insight™ diagnostic solution interfaces with these internal structures to identify and analyze device failures. The Yield Insight™ yield learning software provides a systematic yield learning solution to accelerate yield ramps and improve overall yields.

LogicVision Establshes Presence in China with the Assignment of YOUHE Technology as China Representative

LogicVision Reports First Quarter Financial Results

The Embedded Path to Low DPM and Fast Silicon Bring-Up

Memory Repair Primer: A Guide to Understanding Embedded Memory Repair Options and Issues

Be ready for the explosion in embedded memories
Learn more

Expect more from your test solution
Learn more

Learn more about LogicVision's Automotive Electronics Test Solutions